Polytec Micro.View: Microscope-based 3D Surface Profiler

รหัสสินค้า : Polytec Micro.View

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For more information contact : Nattapon Panaim Tel. 09-9331-4114

* Warranty 1 year. (Machine only) * Please check prices again.

Most flexible and affordable system for 3D profiling with sub-nm precision

With an extended 100 mm Z measurement range and the CST Continuous Scanning Technology, Micro.View® measures complex (micro)topographies at nm resolution. This convenient table-top setup features integrated electronics, with the advanced Focus Finder simplifying and speeding up the measurement procedure.

• Reliable surface roughness analysis in sub-nm precision on various materials thanks to Smart Scanning Technology
• Widest and most variable FoV for flexible roughness analysis (from 0,07 x 0,05 mm up to 13,2 x 9,8 mm)
• True Stitching for unmatched accuracy of wider parts
• Wide Z measurement range of 100mm with full resolution due to Continuous Scanning Technology 
• Recipe-driven measurement for repetitive operations
• Compliant to newest standards as ISO 25178, ISO 21920 and more

Micro.View specializes in high-resolution roughness and texture analysis whether for classic "line" profiling (Ra, Rz,...) or areal analysis (Sa, Sq,..). For applications with increased requirements for automation, serial measurements, or operator-independent workflows, we recommend Micro.View+ with a motorized turret, focus tracker, and advanced automation functions.